Electron beam

Results: 1283



#Item
421Amorphous solid / Pulsed laser deposition / Forsterite / Electron beam physical vapor deposition / Mica / Silicon dioxide / Thin film / Silicon / Chemistry / Matter / Thin film deposition

46th Lunar and Planetary Science Conference[removed]pdf DEPOSITION OF AMORPHOUS SILICATE FILMS FOR EXPERIMENTS ON SURFACE REACTIONS IN MOLECULAR CLOUDS AND PROTOPLANETARY DISKS. A. Tsuchiyama1, A. Miyake1, T. Hama2,

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Source URL: www.hou.usra.edu

Language: English - Date: 2015-01-07 10:25:41
422Electron microscopy / Physics / Science / Focused ion beam / Fib / Ion beam / Semiconductor device fabrication / Thin film deposition / Scientific method

Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RB-QD04[removed]

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-12-24 00:09:03
423Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Microtome / Epoxy / Nanoparticle / Desiccator / Scientific method / Electron microscopy / Science

Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0032

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-12-15 18:58:59
424Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Epoxy / Microtome / Desiccator / Nanoparticle / Electron microscopy / Scientific method / Science

RA-QD02-0032-05_06 Curation data Status Size Transfer

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-11-28 02:45:14
425Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Microtome / Epoxy / Nanoparticle / Desiccator / Electron microscopy / Scientific method / Science

RA-QD02[removed]Curation data Status Size Transfer

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2015-01-14 23:01:49
426Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / Microtome / Epoxy / Nanoparticle / Desiccator / Scientific method / Electron microscopy / Science

Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample Sample ID: RA-QD02-0032

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Source URL: hayabusaao.isas.jaxa.jp

Language: English - Date: 2014-12-15 18:58:58
427Physics / Science / Microtechnology / Electron microscopy / Focused ion beam / Ion beam / Microelectromechanical systems / Photolithography / Nanotechnology / Semiconductor device fabrication / Materials science / Thin film deposition

NanoTech1402002AgeevLO.fm

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Source URL: www.ntmdt.com

Language: English - Date: 2015-01-20 04:11:06
428Surgery / Electron beam / Microbiology / Sterilization / Infection control / Autoclave / Dry heat sterilization / Asepsis / Bacillus stearothermophilus / Medicine / Health / Hygiene

DH_Short Publication (1 column)

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Source URL: www.health.qld.gov.au

Language: English - Date: 2015-03-24 21:09:04
429Free-electron laser / Medical equipment / Experimental particle physics / Argonne National Laboratory / SLAC National Accelerator Laboratory / Linear particle accelerator / DESY / Advanced Photon Source / United States Department of Energy National Laboratories / Physics / Particle accelerators / Electron beam

LEUTL Description The low-energy undulator test line (LEUTL) (Fig. 1) and its various component systems were designed to achieve and explore the Self Amplified Spontaneous Emission (SASE) Free-Electron Laser (FEL) proces

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Source URL: www.aai.anl.gov

Language: English - Date: 2009-07-10 14:22:00
430Electron microscope / Centre for Advanced Microscopy / Microscope / Microscopy / Scanning electron microscope / Transmission electron microscopy / Scanning probe microscopy / Electron backscatter diffraction / Focused ion beam / Scientific method / Science / Electron microscopy

SYDNEY AUSTRALIAN CENTRE FOR & MICROSCOPY MICROSCOPY & MICROANALYSIS

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Source URL: sydney.edu.au

Language: English - Date: 2014-06-04 22:42:49
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